Siglent Technology releases the SDG8000A series of arbitrary waveform generators to facilitate signal testing in complex scenarios. This product features up to four analogue output channels, an output frequency of up to 5 GHz, a maximum modulation bandwidth of 2 GHz, and, for each channel, up to 4GB of sample-point storage, providing longer playback time without sacrificing signal bandwidth. Furthermore, the SDG8000A offers high-speed serial pattern signal output and supports complex multi-level sequence waveforms, dual-pulse, multi-tone, and linear frequency modulation functions, meeting a wide range of testing needs in the communications, industrial, and scientific research fields.

Powerful Multi-Level Sequence Playback Function

• SDG8000A supports the editing and playing functions of segment, sequence and scenario multi-level sequence waves, as well as flexible playing control settings, which makes it easier to create complex sequence waves.
• Up to 5G Sa/s
• Up to 512 Scenarios / 4096 Sequences / 16384 Segments
• 4 Gpts maximum memory depth per channel
• Configurable loop counts and playback order
• Selectable trigger modes: Auto, Manual, Timer, External
• 4 operating modes (Continuous, Triggered, Gated, Advanced) with per-segment trigger control

AWG & Marker Function

• Flexible sequence playback for various test scenarios
• Up to 512 Scenarios / 4096 Sequences / 16384 Segments
• 4 Gpts maximum memory depth per channel
• Configurable loop counts and playback order
• Selectable trigger modes: Auto, Manual, Timer, External
• 4 operating modes (Continuous, Triggered, Gated, Advanced) with per-segment trigger control

Built-In Multi-Pulse, Multi-Tone and Chirp Functions

• The multi-pulse function is output in AWG mode.
• SR Type: Automatic or customised,
• The sampling rate can be customised from 100 Sa/s to 5 GSa/s.
• Pulse count: Up to 30 pulses can be set
• Main applications: Power device switching parameter measurement: For example, turn-on time, turn-off time, and delay time of power semiconductor devices such as MOSFETs and IGBTs.

High-Speed Pulse and Step Signal Testing: Generation of ultra-fast rise-time pulses and step signals for applications such as radar systems, LiDAR, and semiconductor device characterisation (e.g., switching behaviour of diodes and transistors).

High-Speed Serial Bus Testing: With optional serial data generation software, the instrument can generate PCIe and other high-speed serial data patterns for compliance testing, bit error rate (BER) testing, and eye diagram analysis.

Mid- to Low-Frequency Communication Signal Generation: vector signal generation within a 2 GHz mod bandwidth, including 5G NR, Wi-Fi, Bluetooth, and other comms standards, for carrier frequencies up to 5 GHz.

Multi-Instrument Synchronisation: Enables precise timing synchronisation between transmitters, receivers, oscilloscopes, and data acquisition systems with flexible marker outputs.

Custom Arbitrary Waveform Generation: Supports user-defined complex waveforms, including modulation signals, device emulation signals, and noise patterns for advanced system design and validation.

Product Specifications Table

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